Olson Lanjouw, Jean and Schankerman, Mark 
ORCID: 0009-0006-1071-7672
(2002)
Research productivity and patent quality: measurement with multiple indicators.
STICERD Discussion Paper (EI/32).
Suntory and Toyota International Centres for Economics and Related Disciplines, London, UK.
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Abstract
We analyse the determinants of the decline in measured research productivity (the patent/R&D ratio) using panel data on manufacturing firms in the U.S. for the period 1980-93. We focus on three factors: the level of demand, the quality of patents, and technological exhaustion. We first develop an index of patent ‘quality’ using detailed information on patents in the U.S. in seven technology fields. Using a factor model, we construct a minimum-variance index based on four patent characteristics and show that using multiple indicators substantially reduces the measured variance in quality. We then show that research productivity at the firm level is negatively related to the patent quality index and the level of demand, as predicted by an optimizing model of R&D, and positively related to the stock market valuation of patented innovations held by firms.
| Item Type: | Monograph (Discussion Paper) |
|---|---|
| Official URL: | http://sticerd.lse.ac.uk/ |
| Additional Information: | © 2002 The Authors |
| Divisions: | Economics STICERD |
| Subjects: | H Social Sciences > HC Economic History and Conditions H Social Sciences > HB Economic Theory H Social Sciences > HD Industries. Land use. Labor |
| JEL classification: | O - Economic Development, Technological Change, and Growth > O3 - Technological Change; Research and Development > O31 - Innovation and Invention: Processes and Incentives O - Economic Development, Technological Change, and Growth > O3 - Technological Change; Research and Development > O32 - Management of Technological Innovation and R&D |
| Date Deposited: | 05 Mar 2008 14:04 |
| Last Modified: | 01 Oct 2024 03:16 |
| URI: | http://eprints.lse.ac.uk/id/eprint/3729 |
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