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Meta-analytic SEM: a model comparison with/without corrections for study artifacts

Michel, Jesse S., Viswesvaran, Chockalingam and Thomas, Jeffrey ORCID: 0000-0002-5939-5559 (2011) Meta-analytic SEM: a model comparison with/without corrections for study artifacts. In: 26th Annual Society for Industrial and Organizational Psychology conference, 2011-04-14 - 2011-04-16, Hilton, Chicago, United States. (Submitted)

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Abstract

This paper compares substantive conclusions of structural equation models based on meta-analytically derived correlation matrices with and without corrections for study artifacts. All models examined exhibited extremely similar model fit and pathway stability, with the primary difference being greater variance explained in endogenous variables when based on corrected correlations.

Item Type: Conference or Workshop Item (Poster)
Official URL: https://www.siop.org/Annual-Conference
Additional Information: © 2011 The Authors
Divisions: Management
Subjects: H Social Sciences > HA Statistics
Date Deposited: 17 Jan 2020 15:48
Last Modified: 15 Sep 2023 08:37
URI: http://eprints.lse.ac.uk/id/eprint/103112

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